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The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation
Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, Jessnor Arif Mat Jizat, Edmund Yuen, Haochuan Jiang, Eng Hwa Yap, Anwar P. P. Abdul Majeed*
*Corresponding author for this work
Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review