Surface anomaly detection using feature-based transfer learning for IoT-enabled smart manufacturing

Muhammad Ateeq, Matilda Isaac, Hadyan Hafizh, Bintao Hu, Ismail Mohd Khairuddin, Muhammad Amirul Abdullah, Anwar PP Abdul Majeed

Research output: Contribution to conferencePaperpeer-review

Abstract

Owing to the advancement of computational technology, the employment of deep learning architecture for defect detection in the manufacturing industry has gained considerable attention. Traditional means of defect detection through manual vis-ual inspection by operators are laborious as well as susceptible to mistakes. In the present study, a feature-based transfer learning approach is used to classify sur-face defects. The KolektorSDD database is used in the present study. Two pipe-lines were developed to investigate their efficacy in detecting the defects, namely the InceptionV3-SVM and VGG19-SVM pipelines, respectively. It was demon-strated from the study that the VGG19-SVM pipeline could provide desirable re-sults compared to the InceptionV3-SVM pipeline, suggesting that the VGG19 is a better feature extractor for the evaluated surface defects. It could be concluded that the proposed pipeline is suitable for the classification of surface defects.
Original languageEnglish
Number of pages8
Publication statusE-pub ahead of print - 22 Aug 2023
Event7th International Conference on Electrical, Control, and Computer Engineering (InECCE 2023) - Royal Chulan Damansara, Kuala Lumpur, Malaysia
Duration: 22 Aug 202322 Aug 2023
Conference number: 7th
https://events.ump.edu.my/event/others/7th-international-conference-electrical-control-and-computer-engineering-inecce-2023

Conference

Conference7th International Conference on Electrical, Control, and Computer Engineering (InECCE 2023)
Country/TerritoryMalaysia
CityKuala Lumpur
Period22/08/2322/08/23
Internet address

Keywords

  • Smart Manufacturing
  • Metal Surfaces Defects
  • Defect Detection
  • Feature-based Transfer Learning
  • Industry 4.0
  • Industrial IoT
  • Machine Learning
  • Deep learning

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