Spatial identification of traps in AlGaN/GaN heterostructures by the combination of lateral and vertical electrical stress measurements

Anqi Hu, Xuelin Yang, Jianpeng Cheng, Lei Guo, Jie Zhang, Weikun Ge, Maojun Wang, Fujun Xu, Ning Tang, Zhixin Qin, Xinqiang Wang, Bo Shen

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

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