Material Science
Dielectric Material
100%
Thin Films
76%
Devices
70%
Al2O3
61%
Oxide
52%
Thin-Film Transistor
47%
Capacitor
45%
Temperature
42%
Transistor
37%
Irradiation
36%
Oxygen Vacancy
35%
Carbon Nanotube
27%
Oxide Semiconductor
27%
Electrode
26%
Hafnium
24%
Density
24%
Impurity
22%
Metal Oxide
21%
Electronics
20%
Solution
18%
Surface
18%
Resistive Random-Access Memory
16%
Electronic Circuit
16%
Thermogravimetric Analysis
13%
Differential Scanning Calorimetry
13%
Oxidation Reaction
12%
Aluminum Oxide
12%
Germanium
12%
Surface Treatment
12%
Powder
12%
Wettability
12%
Permittivity
12%
Electrical Property
11%
Resin
9%
Optoelectronics
8%
Material
6%
Inverter
6%
Annealing
6%
Ink
6%
Quantum Dot
6%
Physics
Thin Films
62%
Dielectrics
52%
Oxide
44%
Stability
37%
Electric Potential
31%
Responses
30%
Sites
27%
Area
27%
Hafnium
24%
Arrays
24%
Ratios
21%
Aqueous Solution
18%
Radiation Effect
16%
Resistive Switching
16%
Environment
14%
Recognition
14%
Memory
12%
Radiation Hardening
12%
Synapse
12%
Carbon Nanotube
12%
Optoelectronics
12%
Images
12%
Roll
12%
Interfacial Energy
12%
Energy Band
12%
Differences
11%
Radiation Sources
11%
Electrodes
10%
Variations
10%
Technology
10%
Performance
8%
Temperature
8%
Impurities
8%
Rupture
8%
Metal Oxide Semiconductor
7%
Cycles
6%
Independent Variables
6%
Emission
6%
Gamma Radiation
6%
Quality
6%
Electrical Properties
5%
Ultraviolet Radiation
5%
Engineering
Radiation
37%
Dielectrics
37%
Stability
34%
Resistance Ratio
30%
Current Effect
24%
Atomic Layer Deposition
20%
Low Resistance
20%
Resistive Random Access Memory
18%
Resistive
18%
Electric Potential
16%
Oxygen Vacancy
16%
Thin Films
15%
Characteristics
12%
Aqueous Solution
12%
Measurement
12%
Forming
12%
Metallizations
12%
Dominant Mechanism
12%
Conductive Filament
12%
Energy Band
12%
Interfacial Energy
12%
Random Access Memory Device
10%
Cycles
10%
High Resistance State
8%
Mechanisms
7%
Ray Radiation
7%
Interface Trap
7%
Poole-Frenkel Emission
6%
Ohmic Conduction
6%
Nonvolatile Memory
6%
Performance
6%
Applications
6%
Switching
6%
Pepper Noise
6%
Hybrid Optoelectronics
6%
Synaptic Device
6%
Defects
5%
Induced Charge
5%
Gate Bias
5%