Abstract
The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III-V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed.
Original language | English |
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Pages (from-to) | 1510-1513 |
Number of pages | 4 |
Journal | Optics Communications |
Volume | 283 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1 Apr 2010 |
Externally published | Yes |
Keywords
- InAs quantum dots
- Nonlinear refraction
- Reflection Z-scan