The Classification of Wafer Defects: An Evaluation of Different Feature-Based ResNet Transfer Learning Models with Support Vector Machine
Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, Jessnor Arif Mat Jizat, Edmund Yuen, Eng Hwa Yap, Andrew Huey Ping Tan, Anwar P.P. Abdul Majeed*
Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review
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