Abstract
This paper elucidates the details of exciton localization dynamics in InGaN/GaN and GaN/AlInN quantum wells (QWs) using Monte Carlo simulation for a wide range of temperatures (10–300 K). We find that the phonon-induced variation of exciton lifetimes has remarkable effects on the photoluminescence (PL) peak position and the line-width. The red-shift of PL peak position at high temperature is clarified. The combined effects of phonon-induced radiative lifetime of excitons and the band-gap shrinkage at high temperature show the most reasonable agreement with the experimentally observed red-shift of the PL peak position. We have also quantitatively explained the temperature dependence of the W-shaped line-width in both InGaN/GaN and GaN/AlInN QWs. These results are highly significant to understand the emission properties of III-nitride QWs optoelectronic devices.
Original language | English |
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Pages (from-to) | 373-381 |
Number of pages | 9 |
Journal | Journal of Computational Electronics |
Volume | 17 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Mar 2018 |
Externally published | Yes |
Keywords
- Exciton localization
- InGaN/GaN
- Photoluminescence
- Quantum well