Frequency response and hysteresis dispersion scaling in ferroelectric SrBi2Ta2O9 and Pb(Ti0.48Zr 0.52)O3 thin films

J. M. Liu; B. Pan; K. F. Wang; H. Yu

doi:10.1016/j.ceramint.2003.12.142

Frequency response and hysteresis dispersion scaling in ferroelectric SrBi₂Ta₂O₉ and Pb(Ti_0.48Zr _0.52)O₃ thin films

J. M. Liu^*, B. Pan, K. F. Wang, H. Yu

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

14 Citations (Scopus)

Abstract

The dynamic hysteresis of ferroelectric Pb(Ti_0.48Zr _0.52)O₃ (PZT) and Bi₂Sr₂Ta ₅O₉ (SBT) thin films is investigated using the Sawyer-Tower (ST) method, emphasizing the dependence of hysteresis area A against frequency f and amplitude E₀ of applied external electric field. It is revealed that the hysteresis dispersion A(f) under a given E ₀ exhibits a single-peaked pattern with power-law tails in the limits of low and high frequency. Based on the mechanism of ferroelectric domain reversal in which the nucleation and growth sequences occur concurrently, a single-parameter dynamic scaling hypothesis on the hysteresis dispersion is proposed and demonstrated for the two types of ferroelectrics. The effective characteristic time for the domain reversal, inversely proportional to the field amplitude E₀, is predicted.

Original language	English
Pages (from-to)	1471-1475
Number of pages	5
Journal	Ceramics International
Volume	30
Issue number	7
DOIs	https://doi.org/10.1016/j.ceramint.2003.12.142
Publication status	Published - 2004
Externally published	Yes
Event	3rd Asian Meeting on Electroceramics - Singapore, Singapore Duration: 7 Dec 2003 → 11 Dec 2003

Keywords

Dynamic scaling
Ferroelectric hysteresis
Hysteresis dispersion

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10.1016/j.ceramint.2003.12.142

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title = "Frequency response and hysteresis dispersion scaling in ferroelectric SrBi2Ta2O9 and Pb(Ti0.48Zr 0.52)O3 thin films",

abstract = "The dynamic hysteresis of ferroelectric Pb(Ti0.48Zr 0.52)O3 (PZT) and Bi2Sr2Ta 5O9 (SBT) thin films is investigated using the Sawyer-Tower (ST) method, emphasizing the dependence of hysteresis area A against frequency f and amplitude E0 of applied external electric field. It is revealed that the hysteresis dispersion A(f) under a given E 0 exhibits a single-peaked pattern with power-law tails in the limits of low and high frequency. Based on the mechanism of ferroelectric domain reversal in which the nucleation and growth sequences occur concurrently, a single-parameter dynamic scaling hypothesis on the hysteresis dispersion is proposed and demonstrated for the two types of ferroelectrics. The effective characteristic time for the domain reversal, inversely proportional to the field amplitude E0, is predicted.",

keywords = "Dynamic scaling, Ferroelectric hysteresis, Hysteresis dispersion",

author = "Liu, {J. M.} and B. Pan and Wang, {K. F.} and H. Yu",

year = "2004",

doi = "10.1016/j.ceramint.2003.12.142",

language = "English",

volume = "30",

pages = "1471--1475",

journal = "Ceramics International",

issn = "0272-8842",

number = "7",

note = "3rd Asian Meeting on Electroceramics ; Conference date: 07-12-2003 Through 11-12-2003",

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TY - JOUR

T1 - Frequency response and hysteresis dispersion scaling in ferroelectric SrBi2Ta2O9 and Pb(Ti0.48Zr 0.52)O3 thin films

AU - Liu, J. M.

AU - Pan, B.

AU - Wang, K. F.

AU - Yu, H.

PY - 2004

Y1 - 2004

N2 - The dynamic hysteresis of ferroelectric Pb(Ti0.48Zr 0.52)O3 (PZT) and Bi2Sr2Ta 5O9 (SBT) thin films is investigated using the Sawyer-Tower (ST) method, emphasizing the dependence of hysteresis area A against frequency f and amplitude E0 of applied external electric field. It is revealed that the hysteresis dispersion A(f) under a given E 0 exhibits a single-peaked pattern with power-law tails in the limits of low and high frequency. Based on the mechanism of ferroelectric domain reversal in which the nucleation and growth sequences occur concurrently, a single-parameter dynamic scaling hypothesis on the hysteresis dispersion is proposed and demonstrated for the two types of ferroelectrics. The effective characteristic time for the domain reversal, inversely proportional to the field amplitude E0, is predicted.

AB - The dynamic hysteresis of ferroelectric Pb(Ti0.48Zr 0.52)O3 (PZT) and Bi2Sr2Ta 5O9 (SBT) thin films is investigated using the Sawyer-Tower (ST) method, emphasizing the dependence of hysteresis area A against frequency f and amplitude E0 of applied external electric field. It is revealed that the hysteresis dispersion A(f) under a given E 0 exhibits a single-peaked pattern with power-law tails in the limits of low and high frequency. Based on the mechanism of ferroelectric domain reversal in which the nucleation and growth sequences occur concurrently, a single-parameter dynamic scaling hypothesis on the hysteresis dispersion is proposed and demonstrated for the two types of ferroelectrics. The effective characteristic time for the domain reversal, inversely proportional to the field amplitude E0, is predicted.

KW - Dynamic scaling

KW - Ferroelectric hysteresis

KW - Hysteresis dispersion

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U2 - 10.1016/j.ceramint.2003.12.142

DO - 10.1016/j.ceramint.2003.12.142

M3 - Conference article

AN - SCOPUS:4344640408

SN - 0272-8842

VL - 30

SP - 1471

EP - 1475

JO - Ceramics International

JF - Ceramics International

IS - 7

T2 - 3rd Asian Meeting on Electroceramics

Y2 - 7 December 2003 through 11 December 2003

ER -

Frequency response and hysteresis dispersion scaling in ferroelectric SrBi₂Ta₂O₉ and Pb(Ti_0.48Zr _0.52)O₃ thin films

Abstract

Keywords

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