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Dynamic RON Degradation in AlGaN/GaN MIS-HEMTs With Si3N4 or Si3N4/ZrO2Passivation Layer
Ye Liang, Yuanlei Zhang, Xiuyuan He, Yinchao Zhao, Jiudun Yan, Mingxiang Wang, Wen Liu
Research output: Contribution to journal › Article › peer-review