| Translated title of the contribution | Test system of semiconductor device transient capacitance |
|---|---|
| Original language | Chinese (Simplified) |
| Patent granted number | CN204575748U |
| Validity date | 27/03/25 |
| Publication status | Published - 19 Aug 2015 |
一种半导体器件瞬态电容的测试系统
Jingjin Wu (Inventor), Cezhou Zhao (Inventor), Chenguang Liu (Inventor)
Research output: Patent