Voltage scalability of double-gate ultra-thin-body field-effect transistors with channel materials from group IV, III-V to 2D-materials based on ITRS metrics for year 2018 and beyond

Kain Lu Low, Yee Chia Yeo, Gengchiau Liang

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

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Material Science