Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

Benjamen P. Reed^*, David J.H. Cant, Steve J. Spencer, Abraham Jorge Carmona-Carmona, Adam Bushell, Alberto Herrera-Gómez, Akira Kurokawa, Andreas Thissen, Andrew G. Thomas, Andrew J. Britton, Andrzej Bernasik, Anne Fuchs, Arthur P. Baddorf, Bernd Bock, Bill Theilacker, Bin Cheng, David G. Castner, David J. Morgan, David Valley, Elizabeth A. WillneffEmily F. Smith, Emmanuel Nolot, Fangyan Xie, Gilad Zorn, Graham C. Smith, Hideyuki Yasufuku, Jeffery L. Fenton, Jian Chen, Jonathan D.P. Counsell, Jörg Radnik, Karen J. Gaskell, Kateryna Artyushkova, Li Yang, Lulu Zhang, Makiho Eguchi, Marc Walker, Mariusz Hajdyła, Mateusz M. Marzec, Matthew R. Linford, Naoyoshi Kubota, Orlando Cortazar-Martínez, Paul Dietrich, Riki Satoh, Sven L.M. Schroeder, Tahereh G. Avval, Takaharu Nagatomi, Vincent Fernandez, Wayne Lake, Yasushi Azuma, Yusuke Yoshikawa, Alexander G. ShardShow 31 moreShow less