Total Ionizing Dose Response of Hafnium-Oxide Based MOS Devices to Low-Dose-Rate Gamma Ray Radiation Observed by Pulse CV and On-Site Measurements

Yifei Mu, Ce Zhou Zhao, Qifeng Lu, Chun Zhao, Yanfei Qi, Sang Lam, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

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