The Identification of RFID Signal Using k-Means for Pallet-Level Tagging

Chun Sern Choong*, Ahmad Fakhri Ahmad, Anwar P.P. Abdul Majeed, Muhammad Aizzat Zakaria, Mohd Azraai Mohd Razman

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

Radio Frequency Identification (RFID) applications are becoming increasingly popular in a myriad of areas, and therefore, an effective RFID technology-based location would offer a much-needed additional in tracking system. This research focuses on the identification of the location of passive RFID at the pallet-level, which uses the RFID signal strength to cluster the pallet level tagging through k-means. A comparison between the actual and the predicted level attained via the k-means clustering is evaluated through a multi-class performance metrics. It was demonstrated from the investigation that the k-means model is capable of achieving a classification accuracy of 69% and 67% for the train and test data, respectively.

Original languageEnglish
Title of host publicationEmbracing Industry 4.0 - Selected Articles from MUCET 2019
EditorsMohd Azraai Mohd Razman, Jessnor Arif Mat Jizat, Nafrizuan Mat Yahya, Hyun Myung, Amar Faiz Zainal Abidin, Mohamad Shaiful Abdul Karim
PublisherSpringer
Pages195-203
Number of pages9
ISBN (Print)9789811560248
DOIs
Publication statusPublished - 2020
Externally publishedYes
Event11th Malaysian Technical Universities Conference on Engineering and Technology, MUCET 2019 - Kuantan, Malaysia
Duration: 19 Nov 201922 Nov 2019

Publication series

NameLecture Notes in Electrical Engineering
Volume678
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference11th Malaysian Technical Universities Conference on Engineering and Technology, MUCET 2019
Country/TerritoryMalaysia
CityKuantan
Period19/11/1922/11/19

Keywords

  • K-means
  • Pallet-level tagging
  • RFID
  • Unsupervised machine learning

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