Robust electrical characteristics of multiple-layer InAs/GaAs quantum-dot diodes under gamma irradiation

Yifei Mu, S. Lam, C. Z. Zhao, N. Babazadeh, R. A. Hogg, K. Nishi, K. Takemasa, M. Sugawara

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

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