Abstract
Aim: To detect pathological brain conditions early is a core procedure for patients so as to have enough time for treatment. Traditional manual detection is either cumbersome, or expensive, or time-consuming. We aimto offer a systemthat can automatically identify pathological brain images in this paper.Method: We propose a novel image feature, viz., Fractional Fourier Entropy (FRFE), which is based on the combination of Fractional Fourier Transform(FRFT) and Shannon entropy. Afterwards, theWelch's t-test (WTT) andMahalanobis distance (MD) were harnessed to select distinguishing features. Finally, we introduced an advanced classifier: Twin support vector machine (TSVM). Results: A 10 × K-fold stratified cross validation test showed that this proposed "FRFE +WTT + TSVM" yielded an accuracy of 100.00%, 100.00%, and 99.57% on datasets that contained 66, 160, and 255 brain images, respectively. Conclusions: The proposed "FRFE +WTT + TSVM" method is superior to 20 state-of-the-art methods.
Original language | English |
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Pages (from-to) | 8278-8296 |
Number of pages | 19 |
Journal | Entropy |
Volume | 17 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2015 |
Externally published | Yes |
Keywords
- Fractional Fourier entropy
- Fractional Fourier transform
- Machine learning
- Magnetic resonance imaging
- Shannon entropy
- Support vector machine
- Twin support vector machine