TY - GEN
T1 - Large-signal impedance measurements of piezoelectric ultrasonic transducers
AU - Zhong, Xinyi
AU - Lam, Sang
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/6/16
Y1 - 2016/6/16
N2 - This paper reports the use of large-signal impedance measurements to study the behaviour of piezoelectric ultrasonic transducers (PUTs). The method requires only ordinary laboratory equipment including a signal generator, a digital oscilloscope together with a high frequency transformer. Equivalent circuit model parameters are extracted from the impedance measurement data of for investigating the device characteristics of the PUT. Such useful model parameter extraction is not possible from impedance measurements using even a sophistical LCR meter which is for small-signal impedance measurements. This low-cost and simple impedance measurement method is attractive for allowing even undergraduate students to perform research-related experiments.
AB - This paper reports the use of large-signal impedance measurements to study the behaviour of piezoelectric ultrasonic transducers (PUTs). The method requires only ordinary laboratory equipment including a signal generator, a digital oscilloscope together with a high frequency transformer. Equivalent circuit model parameters are extracted from the impedance measurement data of for investigating the device characteristics of the PUT. Such useful model parameter extraction is not possible from impedance measurements using even a sophistical LCR meter which is for small-signal impedance measurements. This low-cost and simple impedance measurement method is attractive for allowing even undergraduate students to perform research-related experiments.
KW - equivalent circuit modeling
KW - impedance measurement
KW - large-signal measurement
KW - piezoelectric ultrasonic transducer
UR - http://www.scopus.com/inward/record.url?scp=84978208793&partnerID=8YFLogxK
U2 - 10.1109/ICEMI.2015.7494319
DO - 10.1109/ICEMI.2015.7494319
M3 - Conference Proceeding
AN - SCOPUS:84978208793
T3 - 2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
SP - 731
EP - 736
BT - 2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
A2 - Jianping, Cui
A2 - Juan, Wu
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015
Y2 - 16 July 2015 through 18 July 2015
ER -