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Investigation of amorphous silicon-carbon films deposited by filtered vacuum cathodic arc
P. Zhang
*
, W. M. Tan, B. K. Tay
*
Corresponding author for this work
Nanyang Technological University
Research output
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peer-review
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Chemistry
Amorphous Silicon
100%
Atomic Force Microscopy
12%
Carbon
100%
Carbon Atom
12%
Chemical Bond
25%
Concentration
12%
Disorder
12%
Liquid Film
100%
Phase Composition
50%
Photoelectron Spectroscopy
25%
Roughness
12%
Sample
12%
Silicon Atom
12%
Silicon Carbide
12%
Surface
12%
Vacuum
100%
Vacuum Arc
12%
Voltage
37%
Wavenumber
12%
Wetting
25%
Material Science
Amorphous Silicon
100%
Atomic Force Microscopy
14%
Carbon Films
100%
Contact Angle
28%
Film
14%
Photoemission Spectroscopy
28%
Raman Spectroscopy
14%
Silicon
100%
Silicon Carbide
14%
Surface Morphology
14%
Chemical Engineering
Angle Measurement
11%
Carbon
100%
Silicon
100%
Silicon Carbide
11%