Hot electron induced non-saturation current behavior at high electric field in InAlN/GaN heterostructures with ultrathin barrier

Lei Guo, Xuelin Yang*, Anqi Hu, Zhihong Feng, Yuanjie Lv, Jie Zhang, Jianpeng Cheng, Ning Tang, Xinqiang Wang, Weikun Ge, Bo Shen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Hot electron induced non-saturation current behavior at high electric field in InAlN/GaN heterostructures with ultrathin barrier'. Together they form a unique fingerprint.

Physics

Engineering