Feature-Based Transfer Learning for IoT-Enabled Defect Detection for Quality Control in Industrial Manufacturing Processes: A DenseNet Evaluation

Anwar P. P. Abdul Majeed, Muhammad Ateeq*, Bintao Hu, Wan Hasbullah Mohd Isa, Zaid Omar, Wei Chen

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

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Chemical Engineering

Material Science

Computer Science