TY - GEN
T1 - Experimental Comparison of AlGaN/GaN-on-Si Schottky Barrier Diode with and Without Recessed Anode
AU - Bu, Qinglei
AU - Cai, Yutao
AU - Cui, Miao
AU - Wen, Huiqing
AU - Liu, Wen
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - Power diodes with low turn-on voltage and high breakdown voltage are highly demanded in order to improve the power conversion efficiency for different applicants. This paper focused on the comparison between the two structures GaN-Schottky barrier diode (SBD), with and without recessed anode schemes, which are utilized with different cathode-to-anode separations (LAC). The electrical characteristics of these devices are illustrated, the turn-on voltage (VT) and breakdown voltage (BV) are compared under the related LAC. The best performance is found with the recessed anode SBD which gives a turn-on voltage of 0.75 V, a BV of 462 V.
AB - Power diodes with low turn-on voltage and high breakdown voltage are highly demanded in order to improve the power conversion efficiency for different applicants. This paper focused on the comparison between the two structures GaN-Schottky barrier diode (SBD), with and without recessed anode schemes, which are utilized with different cathode-to-anode separations (LAC). The electrical characteristics of these devices are illustrated, the turn-on voltage (VT) and breakdown voltage (BV) are compared under the related LAC. The best performance is found with the recessed anode SBD which gives a turn-on voltage of 0.75 V, a BV of 462 V.
KW - Breakdown voltage
KW - lateral AlGaN/GaN Schottky barrier diode
KW - power devices
UR - http://www.scopus.com/inward/record.url?scp=85071464664&partnerID=8YFLogxK
U2 - 10.1109/ICICDT.2019.8790836
DO - 10.1109/ICICDT.2019.8790836
M3 - Conference Proceeding
AN - SCOPUS:85071464664
T3 - 17th IEEE International Conference on IC Design and Technology, ICICDT 2019 - Proceedings
BT - 17th IEEE International Conference on IC Design and Technology, ICICDT 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th IEEE International Conference on IC Design and Technology, ICICDT 2019
Y2 - 17 June 2019 through 19 June 2019
ER -