Evaluating the Reliability of Blockchain Based Internet of Things Applications

Ying Liu*, Kai Zheng, Paul Craig, Yuexuan Li, Yangkai Luo, Xin Huang

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

8 Citations (Scopus)

Abstract

In this paper we describe an evaluation to test the reliability of a blockchain based Internet of Things application using a continuous-time Markov chain model. The factors affecting the reliability in our system include the number of devices, the reliability of individual devices, and the underlying consensus algorithm etc. The effect of some factors on overall system reliability is tested, and we find that the total number of devices has the most significant factor to affect overall system reliability. So that we can improve system reliability according to the affecting factors.

Original languageEnglish
Title of host publicationProceedings of 2018 1st IEEE International Conference on Hot Information-Centric Networking, HotICN 2018
EditorsLei Kai
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages230-231
Number of pages2
ISBN (Electronic)9781538648704
DOIs
Publication statusPublished - 8 Jan 2019
Event1st IEEE International Conference on Hot Information-Centric Networking, HotICN 2018 - Shenzhen,Guangdong, China
Duration: 15 Aug 201817 Aug 2018

Publication series

NameProceedings of 2018 1st IEEE International Conference on Hot Information-Centric Networking, HotICN 2018

Conference

Conference1st IEEE International Conference on Hot Information-Centric Networking, HotICN 2018
Country/TerritoryChina
CityShenzhen,Guangdong
Period15/08/1817/08/18

Keywords

  • Blockchain based IoT
  • Model checking
  • Reliability

Cite this