Electrical and dielectric properties of Al/(PVP: Zn-TeO2)/p-Si heterojunction structures using current–voltage (I–V) and impedance-frequency (Z–f) measurements

Yashar Azizian-Kalandaragh*, Javid Farazin, Şemsettin Altindal, Mehdi Shahedi Asl, Gholamreza Pirgholi-Givi, Seyed Ali Delbari, Abbas Sabahi Namini

*Corresponding author for this work

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