Effect of (Co–TeO2-doped polyvinylpyrrolidone) organic interlayer on the electrophysical characteristics of Al/p-Si (MS) structures

Javid Farazin, Mehdi Shahedi Asl, Gholamreza Pirgholi-Givi, Seyed Ali Delbari, Abbas Sabahi Namini, Şemsettin Altındal, Yashar Azizian-Kalandaragh*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

In this paper, (Co–TeO2) nanostructures were synthesized using the microwave-assisted method for the fabrication of (PVP:Co–TeO2) as an organic interlayer (OI) at Al/p-Si interface. Structural and optical properties of nanostructures were investigated through XRD, SEM, EDX, and UV–Vis techniques. The interface states (Nss) energy dependence diagram were also obtained from the voltage-dependent ideality factor (n) and barrier height (BH). Experimental results confirmed that the OI improved the performance of MS structure in respect of low Nss, Rs, n, and high rectification rate (RR). Both the forward- and reverse-bias conduction mechanisms such as ohmic, space/trap-charge-limited current (SCLC/TCLC), and Poole–Frenkel/Schottky emission (PFE/SE), respectively, were implemented. Additionally, basic dielectric parameters of two structures were investigated in detail using impedance–frequency (Z–f) measurements in a wide frequency range (0.1–1000 kHz) and they were a strong function of frequency because of the existence of Nss, surface polarization, and interlayer.

Original languageEnglish
Pages (from-to)21909-21922
Number of pages14
JournalJournal of Materials Science: Materials in Electronics
Volume32
Issue number17
DOIs
Publication statusPublished - Sept 2021
Externally publishedYes

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