Reliability of Hafnium Oxide Dielectric Thin Film Transistor Devices Prepared by Solution Method

  • Zhao, Chun (PI)
  • Zhao, Cezhou (Team member)
  • Liu, Qihan (Team member)
  • Zhao, Tianshi (Team member)
  • Fang, Yuxiao (Team member)
  • Shen, Zongjie (Team member)

Project: Governmental Research Project

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Material Science