Well-shielded cerium atoms: Electronic structure of adsorbed Ce@C 82 on Si surfaces

K. Schulte*, L. Wang, P. J. Moriarty, J. Purton, S. Patel, H. Shinohara, M. Kanai, T. J.S. Dennis

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The interaction of Ce@C 82 with clean and silver-terminated Si(111) surfaces has been studied with synchrotron-radiation photoemission spectroscopy and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. Use of an Ag/Si(111)-(√3×√3)R30° surface as an initial substrate enables the molecule-substrate interaction to be progressively strengthened through controlled annealing. Although strong covalent bonding and distortion of the fullerene cage are observed following the removal of the Ag-induced reconstruction (above 550°C), the cerium atom's valence and overall electronic structure, as probed by Ce 3d NEXAFS, appear to be remarkably unaffected.

Original languageEnglish
Article number115437
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume71
Issue number11
DOIs
Publication statusPublished - 15 Mar 2005
Externally publishedYes

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