Abstract
With simple compact pads, DC probes were used for measurements of crosstalk and substrate coupling in gallium-nitride (GaN) power integrated circuits (ICs). By proper electrical measurement calibration of the DC probing system, a crosstalk voltage down to 4.4 mV and substrate coupling up to -38 dB were measured up to 25 MHz for a GaN-on-Si power IC, using an oscilloscope and a spectrum analyzer respectively. Despite some accuracy limitations, it is a low-cost viable method for determining especially substrate coupling in power ICs.
Original language | English |
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Title of host publication | 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9798350329896 |
DOIs | |
Publication status | Published - 2024 |
Event | 36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024 - Edinburgh, United Kingdom Duration: 15 Apr 2024 → 18 Apr 2024 |
Publication series
Name | IEEE International Conference on Microelectronic Test Structures |
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ISSN (Print) | 1071-9032 |
ISSN (Electronic) | 2158-1029 |
Conference
Conference | 36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024 |
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Country/Territory | United Kingdom |
City | Edinburgh |
Period | 15/04/24 → 18/04/24 |
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Cui, M., & Lam, S. (2024). Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. In 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings (IEEE International Conference on Microelectronic Test Structures). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS59902.2024.10520677