Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits

Miao Cui; Sang Lam

doi:10.1109/ICMTS59902.2024.10520677

Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits

Miao Cui, Sang Lam^*

^*Corresponding author for this work

Department of Electrical and Electronic Engineering

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

Abstract

With simple compact pads, DC probes were used for measurements of crosstalk and substrate coupling in gallium-nitride (GaN) power integrated circuits (ICs). By proper electrical measurement calibration of the DC probing system, a crosstalk voltage down to 4.4 mV and substrate coupling up to -38 dB were measured up to 25 MHz for a GaN-on-Si power IC, using an oscilloscope and a spectrum analyzer respectively. Despite some accuracy limitations, it is a low-cost viable method for determining especially substrate coupling in power ICs.

Original language	English
Title of host publication	2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350329896
DOIs	https://doi.org/10.1109/ICMTS59902.2024.10520677
Publication status	Published - 2024
Event	36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024 - Edinburgh, United Kingdom Duration: 15 Apr 2024 → 18 Apr 2024

Publication series

Name	IEEE International Conference on Microelectronic Test Structures
ISSN (Print)	1071-9032
ISSN (Electronic)	2158-1029

Conference

Conference	36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024
Country/Territory	United Kingdom
City	Edinburgh
Period	15/04/24 → 18/04/24

Access to Document

10.1109/ICMTS59902.2024.10520677

Cite this

Cui, M., & Lam, S. (2024). Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. In 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings (IEEE International Conference on Microelectronic Test Structures). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS59902.2024.10520677

Cui, Miao ; Lam, Sang. / Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2024. (IEEE International Conference on Microelectronic Test Structures).

@inproceedings{0937bc960d85446a83a21d7f8e3b943b,

title = "Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits",

abstract = "With simple compact pads, DC probes were used for measurements of crosstalk and substrate coupling in gallium-nitride (GaN) power integrated circuits (ICs). By proper electrical measurement calibration of the DC probing system, a crosstalk voltage down to 4.4 mV and substrate coupling up to -38 dB were measured up to 25 MHz for a GaN-on-Si power IC, using an oscilloscope and a spectrum analyzer respectively. Despite some accuracy limitations, it is a low-cost viable method for determining especially substrate coupling in power ICs.",

author = "Miao Cui and Sang Lam",

note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024 ; Conference date: 15-04-2024 Through 18-04-2024",

year = "2024",

doi = "10.1109/ICMTS59902.2024.10520677",

language = "English",

series = "IEEE International Conference on Microelectronic Test Structures",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings",

}

Cui, M & Lam, S 2024, Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. in 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. IEEE International Conference on Microelectronic Test Structures, Institute of Electrical and Electronics Engineers Inc., 36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024, Edinburgh, United Kingdom, 15/04/24. https://doi.org/10.1109/ICMTS59902.2024.10520677

Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. / Cui, Miao ; Lam, Sang.
2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2024. (IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

TY - GEN

T1 - Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits

AU - Cui, Miao

AU - Lam, Sang

PY - 2024

Y1 - 2024

N2 - With simple compact pads, DC probes were used for measurements of crosstalk and substrate coupling in gallium-nitride (GaN) power integrated circuits (ICs). By proper electrical measurement calibration of the DC probing system, a crosstalk voltage down to 4.4 mV and substrate coupling up to -38 dB were measured up to 25 MHz for a GaN-on-Si power IC, using an oscilloscope and a spectrum analyzer respectively. Despite some accuracy limitations, it is a low-cost viable method for determining especially substrate coupling in power ICs.

AB - With simple compact pads, DC probes were used for measurements of crosstalk and substrate coupling in gallium-nitride (GaN) power integrated circuits (ICs). By proper electrical measurement calibration of the DC probing system, a crosstalk voltage down to 4.4 mV and substrate coupling up to -38 dB were measured up to 25 MHz for a GaN-on-Si power IC, using an oscilloscope and a spectrum analyzer respectively. Despite some accuracy limitations, it is a low-cost viable method for determining especially substrate coupling in power ICs.

UR - http://www.scopus.com/inward/record.url?scp=85193509344&partnerID=8YFLogxK

U2 - 10.1109/ICMTS59902.2024.10520677

DO - 10.1109/ICMTS59902.2024.10520677

M3 - Conference Proceeding

AN - SCOPUS:85193509344

T3 - IEEE International Conference on Microelectronic Test Structures

BT - 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 36th IEEE International Conference on Microelectronic Test Structures, ICMTS 2024

Y2 - 15 April 2024 through 18 April 2024

ER -

Cui M , Lam S. Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits. In 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2024. (IEEE International Conference on Microelectronic Test Structures). doi: 10.1109/ICMTS59902.2024.10520677

Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits

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