The application of nonstandard support vector machine in tool condition monitoring system

J. Sun*, G. S. Hong, M. Rahman, Y. S. Wong

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

25 Citations (Scopus)

Abstract

When neural networks are utilized to identify tool states in machining process, the main interest is often on the recognition ability. It is usually believed that a higher classification rate from pattern recognition can improve the accuracy and reliability of tool condition monitoring (TCM), thereby reducing the manufacturing loss. Nevertheless, the two objectives are not identical in most practical manufacturing systems. The aim of this paper is to address this issue and propose a new evaluation function so that the recognition ability of TCM can be evaluated more reasonably. On this basis, two kinds of manufacturing loss due to misclassification are analyzed, and both of them are utilized to calculate corresponding weights in the evaluation function. Then, the potential manufacturing loss is introduced in this work to evaluate the recognition performance of TCM. On the basis of this evaluation function, a modified support vector machine (SVM) approach with two regularization parameters is utilized to learn the information of every tool state. The experimental results show that the proposed method can reliably carry out the identification of tool flank wear, reduce the overdue prediction of worn tool conditions and its relative loss.

Original languageEnglish
Title of host publicationProceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications
Pages295-300
Number of pages6
DOIs
Publication statusPublished - 2004
Externally publishedYes
EventProceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia
Duration: 28 Jan 200430 Jan 2004

Publication series

NameProceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications

Conference

ConferenceProceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications
Country/TerritoryAustralia
CityPerth
Period28/01/0430/01/04

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