Strain status in Fe- and Si- doped GaN epilayers grown on sapphire

C. C. Zheng, J. Q. Ning, J. F. Wang, K. Xu, D. G. Zhao, S. J. Xu

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

The effect of Fe doping on a series of Fe-doped GaN epilayers with difference doping concentrations were studied by Raman spectroscopy with comparison to Si-doped GaN samples. Compressive strain in Fe-dope GaN tend to relax.

Original languageEnglish
Title of host publicationOptoelectronic Devices and Integration, OEDI 2015
PublisherOptical Society of America (OSA)
ISBN (Print)9781943580019
DOIs
Publication statusPublished - 2015
EventOptoelectronic Devices and Integration, OEDI 2015 - Wuhan, China
Duration: 16 Jun 201519 Jun 2015

Publication series

NameOptoelectronic Devices and Integration, OEDI 2015

Conference

ConferenceOptoelectronic Devices and Integration, OEDI 2015
Country/TerritoryChina
CityWuhan
Period16/06/1519/06/15

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