Self-Supervised Learning for Point Clouds through Multi-crop Mutual Prediction

Changyu Zeng*, Wei Wang, Jimin Xiao, Anh Nguyen, Yutao Yue

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

As the demand for high-level autonomous driving continues to grow, efficient processing of large amount of point cloud data from LiDAR sensors has become a severe issue. Despite its great success, it is extremely difficult, if not impossible, to apply supervised learning in many real-world applications with natural scenes lacking annotations. In addition, removing label dependency and improving algorithm generalization ability are the current key research challenges in 3D deep learning. We propose a crop-based self-supervised learning framework for point clouds called Multi-Crop Mutual Prediction (MCMP). By cropping the original point clouds into different number of multiscale patches and making patches from the same object as close as possible through dynamic updates of online prototypes, the encoder is well able to maintain consistency between both local and global features. MCMP framework is model-agnostic so it is convenient to integrate it into encoders of any architectures. We pre-train three commonly used point cloud feature extraction networks on a single object-level dataset MondelNet40 and evaluate MCMP on three downstream tasks, namely, object classification, partial segmentation and semantic segmentation. Experimental results show that MCMP outperforms the previous crop-based self-supervised approaches in the object classification and semantic segmentation tasks and produces comparable results with the supervised benchmark methods.

Original languageEnglish
Title of host publication2023 IEEE 4th International Conference on Pattern Recognition and Machine Learning, PRML 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages160-167
Number of pages8
ISBN (Electronic)9798350324303
DOIs
Publication statusPublished - 2023
Event4th IEEE International Conference on Pattern Recognition and Machine Learning, PRML 2023 - Urumqi, China
Duration: 4 Aug 20236 Aug 2023

Publication series

Name2023 IEEE 4th International Conference on Pattern Recognition and Machine Learning, PRML 2023

Conference

Conference4th IEEE International Conference on Pattern Recognition and Machine Learning, PRML 2023
Country/TerritoryChina
CityUrumqi
Period4/08/236/08/23

Keywords

  • Object Classification
  • Part Segmentation
  • Point Cloud
  • Self-Supervised Learning
  • Semantic Segmentation

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