Reliability Assessment for Dual-Active-Bridge Converter with Fault Tolerant Capability

Yinxiao Zhu, Huiqing Wen*, Qinglei Bu, Guanying Chu, Haochen Shi

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

3 Citations (Scopus)

Abstract

Currently, dual-active-bridge (DAB) converters are widely adopted as the power interface to achieve a bidirectional power flow and galvanic isolation in high-frequency dc power transmission systems. However, the power devices are statistically reported as the main factor of possible failures in practical operation, which is harmful to the stability of power electronic dominated systems. Thus, the fault-tolerant capability is essential for the DAB converter to maintain a reliable system operation, which guarantees the avoidance of faults-induced instability. However, the impact of fault fault-tolerant capability on the system reliability is not thoroughly investigated and quantified. In this paper, the DAB converter-based system is modeled by a simplified reliability model and further developed to the Markov process. The reliability of the DAB converter with and without fault-tolerant capability is analyzed with the proposed mathematical model. Meanwhile, the long-term steady-state availability of the system is investigated in this paper.

Original languageEnglish
Title of host publication2022 IEEE IAS Global Conference on Emerging Technologies, GlobConET 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages381-386
Number of pages6
ISBN (Electronic)9781665443579
DOIs
Publication statusPublished - 2022
Event1st IEEE IAS Global Conference on Emerging Technologies, GlobConET 2022 - Virtual, Arad, Romania
Duration: 20 May 202222 May 2022

Publication series

Name2022 IEEE IAS Global Conference on Emerging Technologies, GlobConET 2022

Conference

Conference1st IEEE IAS Global Conference on Emerging Technologies, GlobConET 2022
Country/TerritoryRomania
CityVirtual, Arad
Period20/05/2222/05/22

Keywords

  • Dual-active-bridge converters
  • fault tolerant
  • Markov process
  • reliability
  • state transient diagram

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