Radiation tolerant DC characteristics of InAs/GaAs quantum-dot diodes

Yifei Mu, Sang Lam, Cezhou Zhao, N. Babazadeh, Richard A. Hogg, K. Nishi, K. Takemasa, M. Sugawara

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

1 Citation (Scopus)

Abstract

Effects of 137Cs gamma irradiation on the DC electrical characteristics of InAs/GaAs quantum dots (QDs) mesa diodes are reported. The devices were irradiated with gamma-rays for different doses ranging from 100 rad to about 1 Mrad (GaAs). The QDs mesa diodes are found to be tolerant to γ radiation. No enhanced leakage current and shift in the turn-on voltage were observed in the InAs/GaAs QD devices after exposure to γ-radiation. When irradiated by γ-rays continuously, there seemed to be a small degradation trend in the forward-bias current after irradiating the mesa diode for about six hours.

Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages110-113
Number of pages4
ISBN (Electronic)9781479983636
DOIs
Publication statusPublished - 30 Sept 2015
Event11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 - Singapore, Singapore
Duration: 1 Jun 20154 Jun 2015

Publication series

NameProceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

Conference

Conference11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
Country/TerritorySingapore
CitySingapore
Period1/06/154/06/15

Keywords

  • InAs/GaAs
  • gamma irradiation
  • radiation effects
  • semiconductor quantum dots

Fingerprint

Dive into the research topics of 'Radiation tolerant DC characteristics of InAs/GaAs quantum-dot diodes'. Together they form a unique fingerprint.

Cite this