Planar surfaces detection on depth map using patch based approach

Zhi Jin*, Tammam Tillo, Fei Cheng

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

1 Citation (Scopus)

Abstract

This paper proposes an unsupervised technique for detecting planar surfaces on single depth map image. The proposed method can detect planar surfaces by adopting dynamic seed growing technique without using texture information. So aided with this mechanism to control the growing process, each seed patch can grow to its maximum extent and then the next seed patch begins to grow. This process avoids over-segmentation of the whole scene. Moreover, it allows detecting semi-planer surfaces. Compared with one popular planar surface detection algorithms, i.e., RANdom SAmples Consensus(RANSAC), the accuracy of the proposed method is superior on typical indoor scenes. The proposed method can have huge technical potential for image/video segmentation and coding, enhancing the depth information of time-of-flight cameras, and finally it could be used for navigation system for humanoid robotics.

Original languageEnglish
Title of host publication2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages227-229
Number of pages3
ISBN (Electronic)9781479951451
DOIs
Publication statusPublished - 3 Feb 2014
Event2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014 - Tokyo, Japan
Duration: 7 Oct 201410 Oct 2014

Publication series

Name2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014

Conference

Conference2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014
Country/TerritoryJapan
CityTokyo
Period7/10/1410/10/14

Keywords

  • Depth Map
  • Planar Surfaces Detection
  • Seed Growing

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