Wouhaybi, R., Balakrishnan, R., Naderializadeh, N., Beirami, A., Di Felice, M., Noghabi, S., Badam, A., & Xu, S. (2022). Guest Editorial: An End-to-End Machine Learning Perspective on Industrial IoT. IEEE Internet of Things Magazine, 5(1), 22-23. https://doi.org/10.1109/MIOT.2022.9773141
Wouhaybi, Rita ; Balakrishnan, Ravikumar ; Naderializadeh, Navid et al. / Guest Editorial : An End-to-End Machine Learning Perspective on Industrial IoT. In: IEEE Internet of Things Magazine. 2022 ; Vol. 5, No. 1. pp. 22-23.
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title = "Guest Editorial: An End-to-End Machine Learning Perspective on Industrial IoT",
author = "Rita Wouhaybi and Ravikumar Balakrishnan and Navid Naderializadeh and Ahmad Beirami and {Di Felice}, Marco and Shadi Noghabi and Anirudh Badam and Shugong Xu",
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doi = "10.1109/MIOT.2022.9773141",
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Wouhaybi, R, Balakrishnan, R, Naderializadeh, N, Beirami, A, Di Felice, M, Noghabi, S, Badam, A & Xu, S 2022, 'Guest Editorial: An End-to-End Machine Learning Perspective on Industrial IoT', IEEE Internet of Things Magazine, vol. 5, no. 1, pp. 22-23. https://doi.org/10.1109/MIOT.2022.9773141
Guest Editorial: An End-to-End Machine Learning Perspective on Industrial IoT. / Wouhaybi, Rita; Balakrishnan, Ravikumar; Naderializadeh, Navid et al.
In:
IEEE Internet of Things Magazine, Vol. 5, No. 1, 01.03.2022, p. 22-23.
Research output: Contribution to journal › Editorial
TY - JOUR
T1 - Guest Editorial
T2 - An End-to-End Machine Learning Perspective on Industrial IoT
AU - Wouhaybi, Rita
AU - Balakrishnan, Ravikumar
AU - Naderializadeh, Navid
AU - Beirami, Ahmad
AU - Di Felice, Marco
AU - Noghabi, Shadi
AU - Badam, Anirudh
AU - Xu, Shugong
PY - 2022/3/1
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U2 - 10.1109/MIOT.2022.9773141
DO - 10.1109/MIOT.2022.9773141
M3 - Editorial
AN - SCOPUS:85193924443
SN - 2576-3180
VL - 5
SP - 22
EP - 23
JO - IEEE Internet of Things Magazine
JF - IEEE Internet of Things Magazine
IS - 1
ER -
Wouhaybi R, Balakrishnan R, Naderializadeh N, Beirami A, Di Felice M, Noghabi S et al. Guest Editorial: An End-to-End Machine Learning Perspective on Industrial IoT. IEEE Internet of Things Magazine. 2022 Mar 1;5(1):22-23. doi: 10.1109/MIOT.2022.9773141