TY - JOUR
T1 - Controllable Fabrication of Au-Coated AFM Probes via a Wet-Chemistry Procedure
AU - Gao, Lizhen
AU - Zhao, Huiling
AU - Li, Yinli
AU - Li, Tianfeng
AU - Chen, Dong
AU - Liu, Bo
N1 - Publisher Copyright:
© 2018, The Author(s).
PY - 2018
Y1 - 2018
N2 - Tip-enhanced Raman spectroscopy (TERS), which offers a spatial resolution far beyond the limitations of the optical diffraction and detection sensitivity down to a single molecular level, has become one of the powerful techniques applied in current nanoscience and technology. However, the excellent performance of a TERS system is very much dependent on the quality of metallized probes used in TERS characterization. Thus, how to prepare higher-quality probes plays a vital role in the development and application of TERS technique. In this work, one simple wet-chemistry procedure was designed to fabricate atomic force microscopy-based TERS (AFM-TERS) probes. Through the controlled growth of a gold film on a commercial silicon AFM probe, TERS probes with different apex diameters were prepared successfully. A series of TERS results indicated that the probes with the apex size of 50~60 nm had the maximum TERS enhancement, and the Raman enhancement factor was in the range of 106 to 107. Compared with those prepared by other fabrication methods, our TERS probes fabricated by this wet-chemistry method have the virtues of good stability, high reproducibility, and strong enhancement effect.
AB - Tip-enhanced Raman spectroscopy (TERS), which offers a spatial resolution far beyond the limitations of the optical diffraction and detection sensitivity down to a single molecular level, has become one of the powerful techniques applied in current nanoscience and technology. However, the excellent performance of a TERS system is very much dependent on the quality of metallized probes used in TERS characterization. Thus, how to prepare higher-quality probes plays a vital role in the development and application of TERS technique. In this work, one simple wet-chemistry procedure was designed to fabricate atomic force microscopy-based TERS (AFM-TERS) probes. Through the controlled growth of a gold film on a commercial silicon AFM probe, TERS probes with different apex diameters were prepared successfully. A series of TERS results indicated that the probes with the apex size of 50~60 nm had the maximum TERS enhancement, and the Raman enhancement factor was in the range of 106 to 107. Compared with those prepared by other fabrication methods, our TERS probes fabricated by this wet-chemistry method have the virtues of good stability, high reproducibility, and strong enhancement effect.
KW - AFM-TERS
KW - Strong enhancement effect
KW - Tip-enhanced Raman spectrum
KW - Wet-chemistry procedure
UR - http://www.scopus.com/inward/record.url?scp=85056816219&partnerID=8YFLogxK
U2 - 10.1186/s11671-018-2789-6
DO - 10.1186/s11671-018-2789-6
M3 - Article
AN - SCOPUS:85056816219
SN - 1931-7573
VL - 13
JO - Nanoscale Research Letters
JF - Nanoscale Research Letters
M1 - 366
ER -