Bayesian inference for Laplace distribution based on complete and censored samples with illustrations

Wanyue Sun, Xiaojun Zhu*, Zhehao Zhang, N. Balakrishnan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, Bayesian estimates are derived for the location and scale parameters of the Laplace distribution based on complete, Type-I, and Type-II censored samples under different prior settings. Subsequently, Bayesian point and interval estimates, as well as the associated statistical inference, are discussed in detail. The developed methods are then applied to two real data sets for illustrative purposes. Moreover, a detailed Monte Carlo simulation study is carried out for evaluating the performance of the inferential methods developed here. Finally, we provide a brief discussion of the established results to demonstrate their practical utility and present some associated problems of further interest. Overall, this study fills an existing gap in the development of Bayesian inferential techniques for the parameters of the two-parameter Laplace distribution, making this research innovative and offering more investigative implications. It showcases the potential for broader methodological applications of Bayesian inference for complex real-world data sets, especially in scenarios involving different forms of censoring. This research provides a critical tool for statistical analysis in different fields such as engineering and finance, where the Laplace distribution is frequently adopted as a fundamental model.

Original languageEnglish
JournalJournal of Applied Statistics
DOIs
Publication statusAccepted/In press - 2024

Keywords

  • Bayesian inference
  • Laplace distribution
  • Monte Carlo simulation
  • Type-I censored samples
  • Type-II censored samples

Fingerprint

Dive into the research topics of 'Bayesian inference for Laplace distribution based on complete and censored samples with illustrations'. Together they form a unique fingerprint.

Cite this