Application of wavelet modulus maxima in microarray spots recognition

X. H. Wang*, Robert S.H. Istepanian, Yong Hua Song

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)

Abstract

This paper presents a novel approach to recognize the microarray image spots. The approach is based on the detection of wavelet modulus maxima in the microarray images. The detected maxima is actually the contour of the spots and thus the spots are recognized precisely. Then, the intensities within the contour of the spots can be obtained with low error rate. The test results on example image show this is an effective approach, especially for those spots with low intensities.

Original languageEnglish
Pages (from-to)190-192
Number of pages3
JournalIEEE Transactions on Nanobioscience
Volume2
Issue number4
DOIs
Publication statusPublished - Dec 2003
Externally publishedYes

Keywords

  • Images processing denoising
  • Microarray
  • Wavelet analysis

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