TY - GEN
T1 - An In-Situ Deep Learning-Based Defect Detection Technology for Additive Manufacturing Process
AU - Wang, Wei
AU - Wang, Peiren
AU - Zhang, Hanzhong
AU - Chen, Xiaoyi
AU - Chen, Min
AU - Li, Ji
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - A trend in the additive manufacturing (AM) area is to deliver full-functional end-use products rather than discrete parts. Therefore, multiple manufacturing processes, additive or traditional, need to be combined to enable complex structure building, various material processing, and end-use functionality actualization. 3D electronics is a type of important product that such AM technologies can produce. However, the whole manufacturing procedure is much more complex than ever before, and any defect that occurs during this period may fail the product. To address the challenge, this paper proposes a deep learning-based defect detection technology to monitor the AM fabrication procedure in situ. An improved YOLOv8 algorithm is developed to train the defect detection model to identify and evaluate the defect image. A dataset of 3550 defects in four categories was created by selecting typical defects of the extrusion 3D printing process to testify to the practicability of this method. Experimental results showed that the improved YOLOv8 model achieves a mean average precision (mAP50) of 91.7% with a frame rate of 71.9 frames per second. In the future, this technology can be deployed on AM apparatus for real-time quality monitoring during the fabrication period. Moreover, depending on the detection results, printing settings can be adjusted real-timely to enhance the success rate of the printing process.
AB - A trend in the additive manufacturing (AM) area is to deliver full-functional end-use products rather than discrete parts. Therefore, multiple manufacturing processes, additive or traditional, need to be combined to enable complex structure building, various material processing, and end-use functionality actualization. 3D electronics is a type of important product that such AM technologies can produce. However, the whole manufacturing procedure is much more complex than ever before, and any defect that occurs during this period may fail the product. To address the challenge, this paper proposes a deep learning-based defect detection technology to monitor the AM fabrication procedure in situ. An improved YOLOv8 algorithm is developed to train the defect detection model to identify and evaluate the defect image. A dataset of 3550 defects in four categories was created by selecting typical defects of the extrusion 3D printing process to testify to the practicability of this method. Experimental results showed that the improved YOLOv8 model achieves a mean average precision (mAP50) of 91.7% with a frame rate of 71.9 frames per second. In the future, this technology can be deployed on AM apparatus for real-time quality monitoring during the fabrication period. Moreover, depending on the detection results, printing settings can be adjusted real-timely to enhance the success rate of the printing process.
KW - additive manufacturing
KW - deep learning
KW - defect detection
KW - machine vision
UR - http://www.scopus.com/inward/record.url?scp=85182741588&partnerID=8YFLogxK
U2 - 10.1109/ICICM59499.2023.10366010
DO - 10.1109/ICICM59499.2023.10366010
M3 - Conference Proceeding
AN - SCOPUS:85182741588
T3 - 2023 8th International Conference on Integrated Circuits and Microsystems, ICICM 2023
SP - 65
EP - 70
BT - 2023 8th International Conference on Integrated Circuits and Microsystems, ICICM 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on Integrated Circuits and Microsystems, ICICM 2023
Y2 - 20 October 2023 through 23 October 2023
ER -