@inproceedings{0b50ff6c3edd4d69917b8cc2dd55a083,
title = "A semi-automated real-time gamma radiation response measurement system for semiconductor device characterisation",
abstract = "This paper describes a semi-automated measurement system for the electrical characterization of the real-time radiation response of electronic devices in the form of semiconductor chips or wafer pieces under gamma irradiation. In-situ I-V and C-V measurements can be performed while the devices are continuously subject to gamma radiation. The system requires no advanced equipment but standard measurement instruments and apparatus. The testing system is feasible for laboratory-scale implementation while keeping the radiation risk of the human operator to a minimum. Measurement results of MOS capacitors are reported using such a system.",
keywords = "I-V and C-V characteristics, MOS capacitors, automated measurement system, gamma irradiation, radiation response, real-time radiation effects",
author = "Yifei Mu and Yanfei Qi and Sang Lam and Cezhou Zhao",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015 ; Conference date: 16-07-2015 Through 18-07-2015",
year = "2016",
month = jun,
day = "16",
doi = "10.1109/ICEMI.2015.7494318",
language = "English",
series = "2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "726--730",
editor = "Cui Jianping and Wu Juan",
booktitle = "2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015",
}