A novel model for product defect detection based on the automatic aspect term extraction

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

Original language	English
Title of host publication	IEEE 27th International Conference on Computer Supported Cooperative Work in Design (CSCWD 2024)
Publisher	IEEE
Publication status	Published - 2024

Cite this

@inproceedings{ac0a79631c2045739e96ed757531a63e,

title = "A novel model for product defect detection based on the automatic aspect term extraction",

author = "Zhongyun Li and Yan Zhao and Yihong Wang and Zongyang Liu and Yushan Pan",

year = "2024",

language = "English",

booktitle = "IEEE 27th International Conference on Computer Supported Cooperative Work in Design (CSCWD 2024)",

publisher = "IEEE",

}