A high refractive index resist for UV-nanoimprint soft lithography based on titanium-containing elemental polymer oligomers

Junlun Qiu, Getian Hu, Yuqiao Wang, Yurui Wang, Ming Luo*, Xin Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

This paper demonstrates a novel resist with a high refractive index for UV-curing nanoimprint lithography based on ano-phenoxyphenyl acrylated polytitanoxane oligomer. The oligomer is synthesized by hydrolysis and condensation of Ti-OEt and theo-phenoxyphenyl groups are grafted onto the backboneviathe reaction betweeno-phenylphenoxyethyl acrylate (OPPEA) and titanium(iv) ethoxide. Acrylate groups are introduced by the chelate reaction between titanium(iv) ethoxide and 2-(methacryloyloxy)ethyl acetoacetate (MAEAA). The chelate rings and benzyl rings greatly improve the resin stability: the resin retains solubility in organic solvents even when it is stored in an air atmosphere for at least 48 hours at room temperature. The resist has an excellent UV transmittance (80% at 365 nm), a high modulus (1.97 GPa) and a high refractive index (1.7063 at 589.3 nm), and the refractive index can be further improved to 1.7327 after baking. A UV-nanoimprint protocol is also optimized and high-resolution patterns with 50 nm line width are faithfully imprinted into the resist film. Furthermore, the resin patterns can be used as a mask for duplicating more PDMS molds, which greatly reduces the risk of master damage.

Original languageEnglish
Pages (from-to)219-226
Number of pages8
JournalJournal of Materials Chemistry C
Volume10
Issue number1
DOIs
Publication statusPublished - 7 Jan 2022
Externally publishedYes

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