| Translated title of the contribution | Multifunctional probe bench test system used for radiation experiment of X-ray and gamma-ray |
|---|---|
| Original language | Chinese (Simplified) |
| Patent granted number | CN102226832B |
| Validity date | 31/03/31 |
| Publication status | Published - 27 Nov 2013 |
可用于X射线,γ射线辐射实验的多功能探针台测试系统
Jingkang Gui (Inventor), Cezhou Zhao (Inventor), Xinli Hu (Inventor)
Research output: Patent