一种缺陷样本的生成方法、装置、电子设备及存储介质

Kaizhu Huang (Inventor), Chaolong Yang (Inventor), Guanyu Yang (Inventor), Weiguang Zhang (Inventor)

Research output: Patent

Original languageChinese (Simplified)
Patent granted numberCN116580267A
Publication statusSubmitted - 30 May 2023
Externally publishedYes

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