Original language | Chinese (Simplified) |
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Patent granted number | CN116580267A |
Publication status | Submitted - 30 May 2023 |
Externally published | Yes |
一种缺陷样本的生成方法、装置、电子设备及存储介质
Kaizhu Huang (Inventor), Chaolong Yang (Inventor), Guanyu Yang (Inventor), Weiguang Zhang (Inventor)
Research output: Patent