Translated title of the contribution | Real-time online test system for gamma ray radiation response of semiconductor devices |
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Original language | Chinese (Simplified) |
Patent granted number | CN105974294B |
Validity date | 5/07/36 |
Publication status | Published - 27 Nov 2018 |
一种半导体器件γ射线辐射响应的实时在线测试系统
Yifei Mu (Inventor), Cezhou Zhao (Inventor)
Research output: Patent