Research on loss model and junction temperature of IGBT for electric vehicles using PSPICE

Wei Hu*, Xuhui Wen, Huiqing Wen, Jun Liu

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

8 Citations (Scopus)

Abstract

IGBT is one of the key components of motor driving system for electric vehicles, and its reliability directly affects the reliability of the electric vehicles. The reliability of the IGBT is affected by the loss and the junction temperature in working condition. To predict the IGBT's loss and thermal response, especially in the case of adverse dynamic conditions, the dynamic loss model and the junction temperature of power IGBT are studied in this paper. This model is then applied to simulate the loss of Eupec's power IGBT FS450R12KE3 used in a motor driving system for electric vehicles developed by the Institute of Electrical Engineering Chinese Academy of Sciences. Simulation results accurately match the measurement. This work can be extended to evaluate power IGBTs in other automotive application such as DC/DC conversion, EPAS and so on.

Original languageEnglish
Title of host publicationProceedings of the 11th International Conference on Electrical Machines and Systems, ICEMS 2008
Pages4123-4126
Number of pages4
Publication statusPublished - 2008
Externally publishedYes
Event11th International Conference on Electrical Machines and Systems, ICEMS 2008 - Wuhan, China
Duration: 17 Oct 200820 Oct 2008

Publication series

NameProceedings of the 11th International Conference on Electrical Machines and Systems, ICEMS 2008

Conference

Conference11th International Conference on Electrical Machines and Systems, ICEMS 2008
Country/TerritoryChina
CityWuhan
Period17/10/0820/10/08

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