@inproceedings{3f7fd49d79614ec39d659fff41b058c2,
title = "Ionizing radiation testing system for emerging semiconductor materials and devices",
abstract = "A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A,an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1GBq Cs 137 γ-ray source.",
keywords = "Ionizing radiation, Probe station, Radiation shielding, Testing system, X-ray, γ-ray",
author = "Xinli Hu and Jingkang Gui and Cezhou Zhao",
year = "2012",
doi = "10.4028/www.scientific.net/AMM.120.495",
language = "English",
isbn = "9783037852811",
series = "Applied Mechanics and Materials",
pages = "495--498",
booktitle = "Product Design and Manufacture",
note = "2011 International Conference on Applied Mechanics, Materials and Manufacturing, ICAMMM 2011 ; Conference date: 18-11-2011 Through 20-11-2011",
}