Ionizing radiation testing system for emerging semiconductor materials and devices

Xinli Hu, Jingkang Gui*, Cezhou Zhao

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

A technical design and implementation method of a ionizing radiation testing system, which is especially applicable to conduct experiments of studying X-ray and γ-ray radiation effects in emerging semiconductor materials and devices, has been demonstrated by connecting components of a PC, a KEITHLEY 487, a HP 8110A,an Agilent 4284A, and a probe station together. The lead thickness of the lead shielding cylinder container is obtained numerically at least 2.1cm for safely holding a 1GBq Cs 137 γ-ray source.

Original languageEnglish
Title of host publicationProduct Design and Manufacture
Pages495-498
Number of pages4
DOIs
Publication statusPublished - 2012
Event2011 International Conference on Applied Mechanics, Materials and Manufacturing, ICAMMM 2011 - Shenzhen, China
Duration: 18 Nov 201120 Nov 2011

Publication series

NameApplied Mechanics and Materials
Volume120
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference2011 International Conference on Applied Mechanics, Materials and Manufacturing, ICAMMM 2011
Country/TerritoryChina
CityShenzhen
Period18/11/1120/11/11

Keywords

  • Ionizing radiation
  • Probe station
  • Radiation shielding
  • Testing system
  • X-ray
  • γ-ray

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