Incipient fault detection based on Just-in-time-learning and wavelet transform for DAB DC-DC converter

Yu Zhang, Xianghua Wang, Rui Yang

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

2 Citations (Scopus)

Abstract

In this paper, a novel fault detection method for incipient fault occurring in Dual-active-bridge (DAB) DC-DC converter is proposed. The incipient fault has the characteristics of small amplitude, weak influence on system performances and easily being covered by noise, hence it is difficult to detect incipient fault for DAB DC-DC converter. This work proposes to use wavelet transform to process data, which can amplify the fault feature and simultaneously weak the noise. And then Just-in-time-learning (JITL) algorithm is utilized to model the system dynamic process online, followed by singular-value-decomposition (SVD) and covariance calculation. The threshold is obtained when applying the proposed method to the normal data, and then to the test data in order to get its covariance, which when is larger than the threshold, an alarm will be triggered to imply the fault occurrence. Finally, establish a simulation model in the Matlab environment, and analyze the experimental results to verify the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings of the 33rd Chinese Control and Decision Conference, CCDC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6245-6250
Number of pages6
ISBN (Electronic)9781665440899
DOIs
Publication statusPublished - 2021
Event33rd Chinese Control and Decision Conference, CCDC 2021 - Kunming, China
Duration: 22 May 202124 May 2021

Publication series

NameProceedings of the 33rd Chinese Control and Decision Conference, CCDC 2021

Conference

Conference33rd Chinese Control and Decision Conference, CCDC 2021
Country/TerritoryChina
CityKunming
Period22/05/2124/05/21

Keywords

  • Covariance
  • Dual-Active-Bridge DC-DC Converter
  • Incipient Fault
  • Just-In-Time-Learning
  • Singular-Value-Decomposition

Fingerprint

Dive into the research topics of 'Incipient fault detection based on Just-in-time-learning and wavelet transform for DAB DC-DC converter'. Together they form a unique fingerprint.

Cite this