Evaluation of the Transfer Learning Models in Wafer Defects Classification

Jessnor Arif Mat Jizat*, Anwar P.P. Abdul Majeed, Ahmad Fakhri Ahmad, Zahari Taha, Edmund Yuen, Shi Xuen Lim

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

2 Citations (Scopus)

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Computer Science