Correction: Deep learning in optical metrology: a review (Light: Science & Applications, (2022), 11, 1, (39), 10.1038/s41377-022-00714-x)

Chao Zuo*, Jiaming Qian, Shijie Feng, Wei Yin, Yixuan Li, Pengfei Fan, Jing Han, Kemao Qian*, Qian Chen*

*Corresponding author for this work

Research output: Contribution to journal › Comment/debate

4 Citations (Scopus)

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