Characterization of Trap States in AlGaN/GaN MIS-High-Electron-Mobility Transistors under Semi-on-State Stress

Ye Liang, Jiachen Duan, Ping Zhang, Kain Lu Low, Jie Zhang*, Wen Liu*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

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